Electrostatic-free piezoresponse force microscopy

Electrostatic-free piezoresponse force microscopy

Contact and non-contact based atomic force microscopy (AFM) approaches have been extensively utilized to explore various nanoscale surface properties. In most AFM-based measurements, a concurrent electrostatic effect between the AFM tip/cantilever and sample surface can occur. This electrostatic effect often hinders accurate measurements. Thus, it is very important to quantify as well as remove...

Vector piezoresponse force microscopy.

A novel approach for nanoscale imaging and characterization of the orientation dependence of electromechanical properties-vector piezoresponse force microscopy (Vector PFM)-is described. The relationship between local electromechanical response, polarization, piezoelectric constants, and crystallographic orientation is analyzed in detail. The image formation mechanism in vector PFM is discussed...

Piezoresponse force microscopy and recent

Contrast mechanism maps for piezoresponse force microscopy

Piezoresponse force microscopy (PFM) is one of the most established techniques for the observation and local modification of ferroelectric domain structures on the submicron level. Both electrostatic and electromechanical interactions contribute at the tip-surface junction in a complex manner, which has resulted in multiple controversies in the interpretation of PFM. Here we analyze the influen...

Higher-eigenmode piezoresponse force microscopy: a path towards increased sensitivity and the elimination of electrostatic artifacts

Piezoresponse forcemicroscopy (PFM) and related bias-induced strain sensing atomic force microscopy techniques provide unique characterization ofmaterial-functionality at the nanoscale. However, these techniques are prone to unwanted artifact signals that influence the vibration amplitude of the detecting cantilever. Here, we show that higher-order contact resonance eigenmodes can be readily ex...